Tuesday, June 29, 2010

Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations

Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations

Rajesh Garg, Sunil P. Khatri, "Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations"
Springer | 2009 | ISBN: 1441909303 | 212 pages | PDF | 4,8 MB 
 
 






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